Journal: Advanced Science

Article Title: Realization of Quasi‐Omnidirectional Solar Cells with Superior Electrical Performance by All‐Solution‐Processed Si Nanopyramids

doi: 10.1002/advs.201700200

Figure Lengend Snippet: a) Reflectance spectra of the untextured, SiMPs‐textured, and SiNPs‐textured surfaces with and without antireflection coating. b) Comparison of τ eff of SiMPs‐textured and SiNPs‐textured samples, which are symmetrically passivated by either i a‐Si:H film or SiN x :H film. c) Comparison of (1/ τ eff − 1/ τ Auger ) of the SiMPs‐textured and the SiNPs‐textured samples symmetrically coated by p/i a‐Si:H films. Also shown is the linear fits of (1/ τ eff − 1/ τ Auger ) versus Δ n , through which J 0e s are determined. d) Cross‐sectional SEM image of SiMPs. e) Cross‐sectional SEM image of SiNPs. f) Comparison of the distribution of αs of the SiMPs and SiNPs.

Article Snippet: The reflectance of the as‐textured and TCO coated samples were measured with QEX10 (PV Measurements) system using integrating sphere attachment.

Techniques: Comparison

Journal: Advanced Science

Article Title: Realization of Quasi‐Omnidirectional Solar Cells with Superior Electrical Performance by All‐Solution‐Processed Si Nanopyramids

doi: 10.1002/advs.201700200

Figure Lengend Snippet: Digital photographs of SiMPs‐textured and SiNPs‐textured wafers taken under a) normal angle and b) tilted angle. Also shown is the photograph of the finished solar cells under tilted angle. c) Definition of the incident angle θ in the study. QE spectra of d) SiMPs‐textured and e) SiNPs‐textured heterojunction solar cells varying with θ together with f) comparison of their QE values at 900 nm. g) Simulated reflectance of SiMPs and SiNPs versus θ with and without antireflection coating. h–k) Light intensity within single SiNP and substrate with different θ. E represents electric field intensity. Incident directions of light are schematically denoted by the arrows.

Article Snippet: The reflectance of the as‐textured and TCO coated samples were measured with QEX10 (PV Measurements) system using integrating sphere attachment.

Techniques: Comparison